61000-4-5 © IEC: 200X2CONTENTS77B/409/CDPageFOREWORD…………………………………………………………………………………………………4INTRODUCTION……………………………………………………………………………………………5Clause1.2.3.4.Scope and object..............................................................................................................6Normative references.......................................................................................................6Definitions........................................................................................................................7General............................................................................................................................84.1Power System Switching transients.........................................................................84.2Lightning transients.................................................................................................84.3Simulation of the transients.....................................................................................9Test levels........................................................................................................................9Test Instrumentation.........................................................................................................96.1Combination wave generator (1,2/50 µs - 8/20 µs).................................................106.210/700 µs surge generator....................................................................................116.3Coupling/decoupling networks, CDN......................................................................13Test set-up.....................................................................................................................167.17.27.3Test equipment.....................................................................................................16Test set-up for tests applied to EUT power ports...................................................16Test set-up for tests applied to unshielded unsymmetrical interconnectionlines......................................................................................................................177.4Test set-up for tests applied to unshielded symmetrical interconnectionstelecommunication lines........................................................................................177.5Test set-up for tests applied to high speed communications lines..........................177.6Test set-up for tests applied to shielded lines........................................................177.7Test set-up to apply potential differences..............................................................187.8Other test set-ups..................................................................................................187.9Test conditions......................................................................................................18Test procedure...............................................................................................................198.1Laboratory reference conditions............................................................................198.2Application of the surge in the laboratory...............................................................19Evaluation of test results................................................................................................2056.7.8.9.10.Test report......................................................................................................................20AnnexesAnnex A (normative) Selection of generators and test levels.....................................................Annex B (informative) Explanatory notes..................................................................................TablesTable 1 - Test levels...............................................................................................................9Table 2 - Definitions of the waveform parameters 1,2/50µs...................................................11Table 3 - Relationship between peak open-circuit voltage and peak short-circuit current.......11Table 4 - Definitions of the waveform parameters of the 10/700 µs generator.......................12Table 5 - Relationship between peak open-circuit voltage and peak short-circuit current.......1261000-4-5 © IEC: 200X377B/409/CDTable 6 - Voltage waveform specification at the EUT output of the coupling/decouplingnetwork, open loop condition with the input to the coupling decoupling network also openloop......................................................................................................................................14Table 7 - Current waveform specification at the EUT output of the coupling/decouplingnetwork, short circuit condition with the input to the coupling decoupling network also openloop......................................................................................................................................14Table A.1 - Selection of the test levels (depending on the installation conditions).................37FiguresFigure 1 - Simplified circuit diagram of the combination wave generator...............................22Figure 2 - Waveform of open-circuit voltage (1,2/50 µs)........................................................23Figure 3 - Waveform of short-circuit current (8/20 µs)...........................................................23Figure 4 - Simplified circuit diagram of the 10/700 µs Surge generator..................................24Figure 5 - Waveform of open-circuit voltage (10/700 µs) (waveform definition according to IEC60060-1)...............................................................................................................................25Figure 6 - Waveform of the 5 µs x 320 µs short-circuit current waveform (definition accordingto IEC 60060-1 and FCC Part 68).........................................................................................25Figure 7 - Example of test set-up for capacitive coupling on a.c./d.c. lines; line-to-line coupling(according to 7.2)..................................................................................................................26Figure 8 - Example of test set-up for capacitive coupling on a.c./d.c. lines; line-to-earthcoupling (according to 7.2)....................................................................................................26Figure 9 - Example of test set-up for capacitive coupling on a.c. lines (3 phases); line L3 toline L1 coupling (according to 7.2)........................................................................................27Figure 10 - Example of test set-up for capacitive coupling on a.c. lines (3 phases); line L3 toearth coupling (according to 7.2)...........................................................................................28Figure 11 - Example of test set up for unshielded unsymmetrical interconnection lines; line-to-line/line-to-earth coupling (according to 7.3), coupling via capacitors....................................29Figure 12 - Example of test set-up for unshielded unsymmetrical interconnection lines; line-to-line/line-to-earth coupling (according to 7.3), coupling via arrestors......................................30Figure 13 - Example of test set-up for unshielded symmetrical interconnection lines(telecommunication lines); line-to-line/line-to earth coupling (according to 7.4), coupling viaarrestors...............................................................................................................................31Figure 14 - Example of a coupling/decoupling network for symmetrical high speedcommunication lines.............................................................................................................32Figure 15 - Example of test set-up for tests applied to shielded lines (according to 7.6) and toapply potential differences (according to 7.7)........................................................................33Figure 16 - Example of test set-up for tests applied to unshielded lines and shielded linesearthed only at one end (according to 7.6) and to apply potential differences (according to7.7)......................................................................................................................................34Figure 17: Coupling method and test set-up for tests applied to shielded lines and to applypotential differences, especially in configurations with multiple shielded cable wiring............35Figure B.1 - Surge injection via injection line extremely close to interface cable between EUT1 and EUT............................................................................................................................4161000-4-5 © IEC: 200X477B/409/CDINTERNATIONAL ELECTROTECHNICAL COMMISSIONELECTROMAGNETIC COMPATIBILITY (EMC)Part 4-5 : Testing and measurement techniques -Surge immunity testFOREWORD1.The IEC (International Electrotechnical Commission) is a worldwide organization forstandardization comprising all national electrotechnical committees (IEC National Committees).The object of the IEC is to promote international cooperation on all questions concerningstandardization in the electrical and electronic fields. To this end and in addition to other activities,the IEC publishes international Standards. Their preparation is entrusted to technical committees;any IEC National Committee interested in the subject dealt with may participate in this preparatorywork. International, governmental and non-governmental organizations liaising with the IEC alsoparticipate in this preparation. The IEC collaborates closely with the international Organization forStandardization (ISO) in accordance with conditions determined by agreement between the twoorganizations.2.The formal decisions or agreements of the IEC on technical matters, prepared by technicalcommittees on which all the National Committees having a special interest therein are represented,express, as nearly as possible, an international consensus of opinion on the subjects dealt with.3.They have the form of recommendations for international use published in the form of standards,technical reports or guides and they are accepted by the National Committees in that sense.4.In order to promote international unification, IEC National Committees undertake to apply IECInternational Standards transparently to the maximum extent possible in their national and regionalstandards. Any divergence between the IEC Standard and the corresponding national or regionalstandard shall be clearly indicated in the letter.5.The IEC provides no marking procedure to indicate its approval and cannot be renderedresponsible for any equipment declared to be in conformity with one of its standards.6.Attention is drawn to the possibility that some of the elements of this International Standard may bethe subject of patent rights. The IEC shall not be held responsible for identifying any or all suchpatent rights.International Standard IEC 61000-4-5 has been prepared by subcommittee 77B: Highfrequency phenomena, of IEC technical Committee 77: Electromagnetic compatibility.It forms part 4-5 of IEC 61000. It has the status of a basic EMC publication in accordancewith IEC guide 107, Electromagnetic compatibility – Guide to the drafting ofelectromagnetic compatibility publications..This second edition cancels and replaces the first edition published in 1995 and itsamendment 1 (2000), and constitutes a revision.The text of this standard IEC 61000-4-5, is based on the following documents:FDIS77B/XX/FDISReport on voting77B/XX/RVDFull information on the voting for the approval of this standard can be found in the reporton voting indicated in the above table.This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.Annex A forms an integral part of this standard.Annex B is for information only.61000-4-5 © IEC: 200X577B/409/CDINTRODUCTIONThis standard is part of the IEC 61000 series, according to the following structure:Part 1: GeneralGeneral considerations (introduction, fundamental principles)Definitions, terminologyPart 2: EnvironmentDescription of the environmentClassification of the environmentCompatibility levelsPart 3: LimitsEmission limitsImmunity limits (in so far as they do not fall under the responsibility of the productcommittees)Part 4: Testing and measurement techniques Measurement techniquesTesting techniquesPart 5: Installation and mitigation guidelinesInstallation guidelinesMitigation methods and devicesPart 6: Generic standardsPart 9: MiscellaneousEach part is further subdivided into several parts, published either as internationalstandards or as technical specifications or technical reports, some of which have alreadybeen published as sections. Others will be published with the part number followed by adash and a second number identifying the subdivision (example : 61000-6-1).This part is an international standard which gives immunity requirements and testprocedures related to surge voltages and surge currents.61000-4-5 © IEC: 200X677B/409/CDELECTROMAGNETIC COMPATIBILITY (EMC)Part 4-5 : Testing and measurement techniques -Surge immunity test1Scope and objectThis part of IEC 61000 relates to the immunity requirements, test methods, and range ofrecommended test levels for equipment to unidirectional surges caused by overvoltages fromswitching and lightning transients. Several test levels are defined which relate to differentenvironment and installation conditions. These requirements are developed for and areapplicable to electrical and electronic equipment.The object of this standard is to establish a common reference for evaluating the immunityof electrical and electronic equipment when subjected to surges. The test methoddocumented in this part of IEC 61000 describes a consistent method to assess theimmunity of an equipment or system against a defined phenomenon.NOTE - As described in IEC guide 107, this is a basic EMC publication for use by product committees of theIEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether thisimmunity test standard should be applied or not, and if applied, they are responsible for determining theappropriate test levels and performance criteria. TC 77 and its sub-committees are prepared to co-operate withproduct committees in the evaluation of the value of particular immunity tests for their products.This standard defines:• range of test levels;• test equipment;• test set-up;• test procedure.The task of the described laboratory test is to find the reaction of the EUT under specifiedoperational conditions caused by surge voltages from switching and lightning effects atcertain threat levels.It is not intended to test the capability of the insulation to withstand high-voltage stress. Directlightning is not considered in this standard.2Normative referencesThe following normative documents contain provisions which, through reference in this text,constitute provisions of this part of IEC 61000. At the time of publication, the editionsindicated were valid. All normative documents are subject to revision, and parties toagreements based on this part of IEC 61000 are encouraged to investigate the possibility ofapplying the most recent editions of the normative documents indicated below. Members ofIEC and ISO maintain registers of currently valid International Standards.IEC 60050(161), International Electrotechnical Vocabulary (IEV) - Chapter 161:Electromagnetic compatibilityIEC 60060-1, High-voltage test techniques - Part 1: General definitions and test requirementsIEC 60469-1, Pulse techniques and apparatus - Part 1: Pulse terms and definitions61000-4-5 © IEC: 200X3Definitions777B/409/CDFor the purposes of this part of IEC 61000, the following definitions together with those in IEC60050(161) apply, unless otherwise stated.3.1calibration: set of operations which establishes, by reference to standards, therelationship which exists, under specified conditions, between an indication and a result of ameasurement [IEV 311-01-09]NOTE 1 - This term is based on the \"uncertainty\" approach.NOTE 2 - The relationship between the indications and the results of measurement can beexpressed, in principle, by a calibration diagram.3.2coupling network: Electrical circuit for the purpose of transferring energy from onecircuit to another.3.3decoupling network: Electrical circuit for the purpose of preventing surges applied tothe EUT from affecting other devices, equipment or systems which are not under test.3.4duration: The absolute value of the interval during which a specified waveform orfeature exists or continues. [IEC 60469-1]3.5 effective output impedance (of a surge generator): the ratio of peak open circuitvoltage to the peak short circuit current.3.6electrical installation: An assembly of associated electrical equipment to fulfill aspecific purpose or purposes and having co-ordinated characteristics. [IEV 826-01-01]3.73.8EUT: Equipment under test.Front timesurge voltage: The front time T1 of a surge voltage is a virtual parameter defined as 1,67times the interval T between the instants when the impulse is 30 % and 90 % of the peakvalue (see figure 2).surge current: The front time T1 of a surge current is a virtual parameter defined as 1,25times the interval T between the instants when the impulse is 10 % and 90 % of the peakvalue (see figure 3). [IEC 60060-1 modified]3.9high-speed communication lines consist of input/output lines which operate atspeeds above 100 kb/s.3.10immunity: The ability of a device, equipment or system to perform without degradationin the presence of an electromagnetic disturbance. [IEV 161-01 -20]3.11interconnection lines consist of I/O lines (input/output lines) and communication linesoperating up to 100 kb/s;3.12primary protection: The means by which the majority of stressful energy is preventedfrom propagating beyond the designated interface.3.13 rise time: The interval of time between the instants at which the instantaneous value ofa pulse first reaches a specified lower value and then a specified upper value.NOTE - Unless otherwise specified, the lower and upper values are fixed at 10 % and 90 % of the pulsemagnitude. [IEV 161-02-05]3.14secondary protection: The means by which the let-through energy from primaryprotection is suppressed. It may be a special device or an inherent characteristic of the EUT.61000-4-5 © IEC: 200X877B/409/CD3.15surge: A transient wave of electrical current, voltage, or power propagating along aline or a circuit and characterized by a rapid increase followed by a slower decrease. [IEV161-08-11 modified].3.16symmetrical lines: A pair of symmetrically driven conductors with a conversion lossfrom differential to common mode of greater than 20 dB.3.17system: Set of interdependent elements constituted to achieve a given objective byperforming a specified function.NOTE - The system is considered to be separated from the environment and other external systems by animaginary surface which cuts the links between them and the considered system. Through these links, the systemis affected by the environment, is acted upon by the external systems, or acts itself on the environment or theexternal systems. [IEV 351-01-01]3.18time to half-value T2: The time to half-value T2 of a surge is a virtual parameterdefined as the time interval between the virtual origin O1 and the instant when the voltage orcurrent has decreased to half the peak value. [IEC 60060-1 modified]3.19transient: Pertaining to or designating a phenomenon or a quantity which variesbetween two consecutive steady states during a time interval short compared to the timescale of interest. [IEV 161-02-01]3.20 verification: set of operations which is used to check the test equipment system(e.g. the test generator and the interconnecting cables) to demonstrate that the test systemis functioning within the specifications given in Clause 6NOTE 1 - The methods used for verification may be different from those used for calibration.NOTE 2 - The procedure of 6.1.2 and 6.2.2 is meant as a guide to insure the correct operation of thetest generator, and other items making up the test set-up that the intended waveform is delivered to theEUT.NOTE 3 - For the purpose of this basic EMC standard this definition is different of the definition givenin the IEV (311-01-13)3.21virtual Origin O1: The point in time where a straight line drawn between the 30 %and 90% amplitude values for the surge voltage waveform or 10 % and 90 % amplitude valuesfor the surge current waveform crosses the time axis.44.1GeneralPower System Switching transientsPower System Switching transients can be separated into transients associated with:a)major power system switching disturbances, such as capacitor bank switching;b)minor switching activity near the instrumentation or load changes in the powerdistribution system;c) ) if the source of interference is not in the same circuit as are the ports of the victim equipment(i.e. indirect coupling), then the generator may simulate a higher impedance source;d) various system faults, such as short circuits and arcing faults to the earthing system ofthe installation.4.2Lightning transientsThe major mechanisms by which lightning produces surge voltages are the following:a)direct lightning stroke to an external circuit (outdoor) injecting high currents producingvoltages by either flowing through earth resistance or flowing through the impedance of theexternal circuit;61000-4-5 © IEC: 200X977B/409/CDb)an indirect lightning stroke (i.e. a stroke between or within clouds or to nearby objectswhich produces electromagnetic fields) that induces voltages/currents on the conductorsoutside and/or inside a building;c)lightning earth current flow resulting from nearby direct-to-earth discharges couplinginto the common earth paths of the earthing system of the installation.The rapid change of voltage and flow of current which can occur as a result of the operationof a lightning protection device can induce electromagnetic disturbances into adjacentequipment.4.3Simulation of the transientsa)The characteristics of the test generator are such that it simulates the abovementioned phenomena as closely as possible;b)if the source of interference is in the same circuit, e.g. in the power supply network(direct coupling), the generator may simulate a low impedance source at the ports of theequipment under test;c)if the source of interference is not in the same circuit as the victim equipment (indirectcoupling) as the ports of the victim-equipment, then the generator may simulate a higherimpedance source.5Test levelsThe preferential range of test levels is given in table 1.Table 1 - Test levelsOpen-circuit test voltageLevel1234X± 10 %kV0,51,02,04,0SpecialNOTE - x is an open class. This level can be specified in the productspecification.The test levels shall be selected according to the installation conditions; classes of installationare given in B.3 of annex B.All voltages of the lower test levels shall be satisfied (see 8.2).For selection of the test levels for the different interfaces, refer to annex A.6Test InstrumentationNOTE - The characteristics of surge generators given in clause 6 are meant as a guide to insure thecorrect operation of the test generator, coupling/decoupling networks, and other items making up thetest set-up so that the intended waveform is delivered to the EUT.Two types of surge generators are specified. Each has its own particular applications, depending onthe type of port to be tested (see Clause 7).61000-4-5 © IEC: 200X6.11077B/409/CDCombination wave generator (1,2/50 µs - 8/20 µs)This generator is intended to generate a surge having: an open circuit voltage front time of1,2 µs; an open circuit voltage time to half value of 50 µs; a short circuit current front time of 8µs; and a short circuit current time to half value of 20 µs.A simplified circuit diagram of the generator is given in figure 1. The values are selected forthe different components RS1, RS2, Rm, Lr, and Cc so that the generator delivers a 1,2/50 µsvoltage surge (at open-circuit conditions) and a 8/20 µs current surge into a short circuit.For convenience, the ratio of peak open-circuit output voltage to peak short-circuit current of acombination wave generator may be considered the effective output impedance. For thisgenerator, the ratio defines an effective output impedance of 2 ohms.Such a generator with 1,2/50 µs open-circuit voltage waveform 8/20 µs short-circuit currentwaveform is called a combination wave generator (CWG).NOTE - The waveform of the voltage and current is a function of the EUT input impedance. This impedance maychange during surges to equipment and due either to proper operation of the installed protection devices, or toflash over or component breakdown, if the protection devices are absent or inoperative. Therefore the 1,2/50 µsvoltage and the 8/20 µs current waves have to be available from the same test generator output asinstantaneously required by the load.6.1.1Characteristics and performance of the combination wave generatorpositive and negativein a range between 0° to 360° versus thephase angle of the ac line voltage to theequipment under test, with a tolerance of+/- 10 degrees1 per min or fasterAdjustable from 0,5 kVsee Table 2 and figure 2± 10 %0,25kA to 2,0kA depending on peakvoltage setting (see table 3), highercurrents are possible with higher peakvoltagessee figure 3± 10 %2 Ω ± 10 %PolarityPhase shiftingRepetition rateOpen-circuit peak output voltage:Waveform of the surge voltageOutput voltage setting toleranceShort-circuit peak output currentWaveform of the surge currentShort-circuit output current toleranceEffective output impedance61000-4-5 © IEC: 200X1177B/409/CDTable 2 – Definitions of the waveform parameters 1,2/50µsDefinitionsFront Timeµs1,28Time to Half Valueµs5020Open-circuit VoltageShort-circuit CurrentNOTE - In existing IEC publications, the waveforms 1,2/50 µs and 8/20 µs are generallydefined according to IEC 60060-1 as shown in figures 2, and 3.Table 3 - Relationship between peak open-circuit voltage and peak short-circuit currentOpen circuit peak voltage ± 10 %0,5 kV1,0 kV2,0 kV4,0 kVShort circuit peak current ± 10 %0,25 kA0,5 kA1,0 kA2,0 kAThe peak short-circuit current shall be as shown in Table 3 when the peak open circuit voltageis as specified.A generator with floating output shall be used.6.1.2Characteristics of the combination wave generatorIn order to compare the test results from different test generators, the test generator shall becalibrated periodically. For this purpose, the following procedure is necessary to measure themost essential characteristics of the generator.The test generator output shall be connected to a measuring system with a sufficientbandwidth and voltage capability to monitor the characteristics of the waveforms.The characteristics of the generator shall be measured under open-circuit conditions (loadgreater than or equal to 10 kΩ) and under short-circuit conditions (load smaller than or equalto 0,1 Ω) at the same charge voltage.All waveform definitions as well as the performance parameters stated in clauses 6.1.1 and6.1.2 respectively shall be met at the output of the surge generator.NOTE - When an additional internal or external resistance is added to the generator output to increase theeffective source impedance from 2 Ω to e.g. 42 Ω according to the requirements of the test set-up, the duration ofthe test pulse at the output of the coupling network might be significantly changed.6.210/700 µs surge generatorThis generator is intended to generate a surge having: an open-circuit voltage front time of10µs; and an open-circuit voltage time to half value of 700 µs. The simplified circuit diagramof the generator is given in figure 4. The values for the different components are selected sothat the generator delivers a 10/700 µs surge.61000-4-5 © IEC: 200X6.2.11277B/409/CDCharacteristics and performances of the 10/700 µs surge generatorpositive and negative1 per min or fasterAdjustable from 0,5kV to 4,0kVsee figure 5± 10 %12,5A to 100A (see table 4)± 10 %40 Ω ± 10 %PolarityRepetition rateOpen-circuit peak output voltageWaveform of the surge voltageOutput voltage setting toleranceShort-circuit peak output currentTolerance of the short-circuit output currentEffective output impedanceTable 4 – Definitions of the waveform parameters of the 10/700 µs generatorDefinitionsFront Timeµs105Time to Half Valueµs700320Open-circuit VoltageShort-circuit CurrentNote - Voltage waveforms definitions are defined according to IEC 60060-1 as shown infigures 2, 3 and 5.Table 5 - Relationship between peak open-circuit voltage and peak short-circuit currentOpen circuit peak voltage ± 10 %0,5 kV1,0 kV2,0 kV4,0 kVShort circuit peak current ± 10 %12,5 A25 A50 A100 AThe peak short-circuit current shall be as shown in Table 4 when the peak open-circuitvoltage is as specified.6.2.2Characteristics and performance of the 10/700 µs surge generatorIn order to compare the test results from different test generators, the test generator shall becalibrated periodically. For this purpose, the following procedure is necessary to measure themost essential characteristics of the generator.The test generator output shall be connected to a measuring system with a sufficientbandwidth and voltage capability to monitor the characteristics of the waveforms.The characteristics of the generator shall be measured under open-circuit conditions (loadgreater than or equal to 10 kΩ) and under short-circuit conditions (load smaller than or equalto 0,1 Ω) at the same charge voltage.All waveform definitions as well as the performance parameters of the test generator shallmeet the specifications mentioned in 6.1.1 and 6.2.1 respectively at the output of thegenerator.61000-4-5 © IEC: 200X1377B/409/CD6.3Coupling/decoupling networks, CDNThe coupling/decoupling network for the AC mains shall be designed so that the open circuitvoltage wave and short circuit current wave meet the tolerance requirements of table 6 and 7.When coupling to interconnection lines, the waveforms may be distorted by the couplingmechanism as described in 6.3.2.1, 6.3.2.2 and 6.3.2.3.Each coupling/decoupling network consists of a decoupling network and a coupling elementas shown in the examples of figures 7 through 14.On the AC mains, the decoupling network provides relatively high back impedance to thesurge waveform but at the same time, allows a.c mains current to flow to the EUT. This backimpedance allows the voltage waveform to be developed at the output of thecoupling/decoupling network and prevents surge current from flowing back into the a.c source.High voltage capacitors are used as the coupling element, sized to allow the full waveformdurations to be coupled to the EUT.For I/O and telecom lines, the series impedance of the decoupling network will limit theavailable bandwidth for data transmission. Clause 6.3.3 describes a procedure to be used inthe case where a test cannot be performed with a coupling/decoupling network in place.Coupling elements can be a capacitor, in cases where the line will tolerate the capacitiveloading effects (6.3.2.1), or an arrestor (6.3.2.2, and 6.3.2.3).Each coupling/decoupling network shall satisfy the following requirements:6.3.1 Coupling-/decoupling networks for a.c./d.c. power supply circuits(used with combination wave generator)The front time and time to half value shall be verified for voltage under open circuit conditionsand for current under short circuit conditions.The test generator output or its coupling network shall be connected to a measuring systemwith a sufficient bandwidth and voltage capability to monitor the open circuit voltagewaveform.The open circuit voltage waveform at the output of the coupling/decoupling networks for AC orDC power supply circuits is selected as follows:18 µF for “line to line coupling”9 µF + 10 Ω for “line to ground coupling”It is desirable that the open circuit voltage waveform at the output of the coupling/decouplingnetwork meet the specifications given in figure 2; however, with higher currentcoupling/decoupling networks this may not be possible.The decoupling inductance shall be selected by the simulator's manufacturer so that the a.cmains voltage drop at EUT connector of the coupling-/decoupling network is less than 10 % atthe specified current rating, but should not exceed 1,5mH.To prevent unwanted voltage drops in the coupling/decoupling networks, the value of thedecoupling element generally must be reduced for coupling/decoupling networks rated at >25 A. For this case the “time to half value” of the open-circuit voltage waveform may bereduced in accordance with Tables 6 and 7, below.61000-4-5 © IEC: 200X1477B/409/CDTable 6: Voltage waveform specification at the EUT output of the coupling/decouplingnetwork, open loop condition with the input to the coupling decoupling network alsoopen loopSurge voltage parameters:Coupling impedance18 µFFront time:Time to half value:current rating < 25 Acurrent rating 25 - 60 Acurrent rating 60 - 100 A50 µs +10µs/-10µs50 µs +10µs/-15µs50 µs +10µs/-20µs50 µs +10µs/-20µs50 µs +10µs/-25µs50 µs +10µs/-30µs1,2 µs ± 30 %9 µF + 10 Ω1,2 µs ± 30 %Table 7: Current waveform specification at the EUT output of the coupling/decouplingnetwork, short circuit condition with the input to the coupling decoupling network alsoopen loopSurge current parameters:Coupling impedance18 µFFront time:Time to half value:8 µs ± 20 %20 µs ± 20 %9 µF + 10 Ω2,5 µs ± 30 %25 µs ± 30 %Note: For EUT having a rated input current above 100 A (at 100 V), direct surge coupling of an un-powered EUT without the use of a coupling/decoupling network, may be the only viable test method.Partial testing of the EUT (e.g. of the control unit alone) is acceptable when it is not possible to surgetest an entire system due to AC mains current requirements of greater than 100A.The residual surge voltage on the power supply inputs of the decoupling network when the EUT isdisconnected shall not exceed 15 % of the applied test voltage or twice the peak value of the powerline voltage whichever is higher.The residual surge voltage on unsurged lines shall not exceed 15% of the maximumapplicable test voltage when the EUT is disconnected and the input is open circuit.The above-mentioned characteristics for single-phase systems (line, neutral, protective earth)are also valid for three-phase systems (three-phase wires, neutral and protective earth).6.3.2 Coupling/decoupling networks for interconnection linesThe coupling method shall be selected as a function of the circuits and operational conditions.This has to be specified in the product specification/standard.Arrestor coupling is used in cases where the capacitive coupling is not possible because offunctional problems or loading caused by attachment of capacitors to the interconnection line.Testing using a coupling/decoupling network with capacitive coupling may not produce thesame test results as with when arrestor coupling is used. If a particular coupling method ispreferred, it should be specified in the product standards. In any case, the coupling methodused should be documented in the test report.6.3.2.1Capacitive coupling for interconnection linesThe capacitive coupling is the preferred method for unshielded unsymmetrical I/O circuits iffunctional communications on that line can be maintained. An example of a coupling networkis shown in figure 11.61000-4-5 © IEC: 200X1577B/409/CDRated characteristics of the coupling/decoupling network:Coupling element R = 40 Ω, C = 0,5 µFDecoupling inductors L = 20 mH6.3.2.2Coupling via clamping devicesThe method can also be used in cases where the capacitive coupling is not possible becauseof functional problems caused by attachment of capacitors to the EUT (see figure 11). Someclamping devices have a low parasitic capacitance and will allow connection to many types ofI/O lines.When coupling with a clamping device, the capacitor shown in figure 11 is replaced by a thatclamping device.The clamp voltage of the device must be selected to be as low as possible but higher than themaximum working voltage of the lines to be tested.Rated characteristics of the coupling-/decoupling network:Coupling impedance R = 40 Ω plus the impedance of the selected clamping deviceDecoupling inductors L = 20 mHThe impulse shape at the EUT output is dependent on the impulse amplitude and thecharacteristics of the clamping device itself; therefore, it is not possible to specify waveformvalues and tolerances.6.3.2.3 Coupling via avalanche devicesThe method can also be used in cases where the capacitive coupling is not possible becauseof functional problems caused by attachment of capacitors to the EUT (see figure 11). Siliconavalanche devices or gas discharge arrestors have a low parasitic capacitance and will allowconnection to most types of I/O lines.Figure 12 shows an example of a coupler using arrestors.The operating voltage of the arrestor must be selected to be as low as possible but higherthan the maximum working voltage of the lines to be tested.Rated characteristics of the coupling-/decoupling network:Coupling impedance R = 40 Ω plus the arrestor impedance (gas-filled or solid state)Decoupling inductors L = 20 mHThe impulse shape at the EUT output is dependent on the impulse amplitude and thecharacteristics of the avalanche device itself; therefore, it is not possible to specify waveformvalues and tolerances.6.3.2.4Coupling via arrestors to symmetrical linesCoupling via arrestors is the preferred coupling method for unshielded symmetrical circuits(telecommunication), as shown in figure 13.The coupling network also has the task of splitting the surge current into multiple pairs inmulti-conductor cables.Therefore the resistance Rm2 in the coupling network shall be, for n composite conductors,n x 40 Ω (for n equal to or greater than 2). Rm2 shall not exceed 250 Ω.EXAMPLE 1: for 1,2/50 µs surges: n = 4, Rm2 = 4 x 40 Ω. With the impedance of thegenerator the total value is approximately 42 Ω.61000-4-5 © IEC: 200X1677B/409/CDEXAMPLE 2: for 10/700 µs surges: n = 4, Rm2 = 4 x 25 Ω. With the impedance Rm1 (15 Ω) ofthe generator the total value is approximately 40 Ω while S1 in the generator is closed, seeFigure 4.Rated characteristics of the coupling-/decoupling network:Coupling impedance Rm2 plus the impedance of the arrestorDecoupling inductors L = 20 mHThe impulse shape at the EUT output is dependent on the impulse amplitude and thecharacteristics of the avalanche device itself; therefore, it is not possible to specify waveformvalues and tolerances.6.3.3 Coupling/decoupling networks for high-speed communication linesBecause of physical constraints, most coupling/decoupling networks are limited to handlingdata rates of up to about 100 kHz. In cases where no adequate coupling/decoupling networkis commercially available, surges shall be applied to the high-speed communication data portdirectly.The coupling method shall be selected as a function of the circuits and operational conditions.This has to be specified in the product specification.High speed communication lines such as ISDN or xDSL require low impedance in thedecoupling network path in order to operate and an example of a suitable coupling/decouplingnetwork is given in figure 14. This will only work for the 1,2/50us combination wave since theinductors will likely saturate with the longer 10/700us telecom waveform.77.1Test set-upTest equipmentThe following equipment is part of the test set-up:- equipment under test (EUT);- auxiliary equipment (AE) when required;- cables (of specified type and length);- coupling/decoupling networks;- test generator (combination wave generator, 10/700 µs surge generator);- decoupling network/protection devices;- earth reference in the form of a metal plate is allowed when high frequency events are likely(i.e., coupling via gas arrestors). Connection to an earth reference is only done when the EUTis normally installed with an earth reference connection.7.2Test set-up for tests applied to EUT power portsThe 1,2/50 µs surge is to be applied to the EUT power supply terminals via the capacitivecoupling network (see figures 7, 8, 9 and 10). Decoupling networks are required in order toavoid possible adverse effects on equipment not under test that may be powered by the samelines and to provide sufficient decoupling impedance to the surge wave so that the specifiedwave may be applied on the lines under test.If not otherwise specified the power cord between the EUT and the coupling/decouplingnetwork shall not exceed 2 m in length.61000-4-5 © IEC: 200X1777B/409/CDTo simulate the representative coupling impedance, coupling/decoupling networks mayinclude additional specified resistors for the tests (explanations, refer to B.1 of annex B).7.3Test set-up for tests applied to unshielded unsymmetrical interconnection linesIn general, the surge is applied to the lines in accordance with figure 11 via capacitivecoupling. The coupling/decoupling network shall not influence the specified functionalconditions of the circuits to be tested.An alternative test set-up (coupling via arrestors) is given in figure 12 for circuits with a highersignal transfer rate. Selection shall be made depending on the capacitive load with respect tothe transmission frequency.If not otherwise specified, the interconnection line between the EUT and the coupling/decoupling network shall not exceed 2 m in length.7.4Test set-up for tests applied to unshielded symmetrical interconnectionstelecommunication linesFor symmetrical interconnection/telecommunication circuits (see figure 13), the capacitivecoupling method can normally not be used. In this case, the coupling is performed via gasarrestors. Test levels below the ignition point of the coupling arrestor (about 300 V for a 90 Vgas arrestor) cannot be specified.NOTE - Two test configurations are to be considered:1. For the equipment level immunity test with only secondary protection at the EUT at a low test level, e.g. 0,5 kVor 1 kV,2. For the system level immunity test with additional primary protection at a higher test level, e.g. 2 kV or 4 kV.If not otherwise specified the interconnection line between the EUT and thecoupling/decoupling network shall not exceed 2 m in length.7.5 Test set-up for tests applied to high speed communications linesOnce the port is determined to be functional, data lines are removed and the surge is applieddirectly to the telecom terminals with no coupling/decoupling network. After the surge, thedata port must be re-tested to insure functionality. The EUT should be functional during thesurge test with the port disconnected; however, it is noted that some EUTs may attempt toshut down or disconnect communications ports internally if the data/telecom line is removed.If possible, steps should be taken to keep the data/telecom port active during the test.7.6Test set-up for tests applied to shielded linesIn the case of shielded lines a coupling/decoupling network may not be applicable, in whichcase the set-up in 7.6.1 or 7.6.2 should be used.7.6.1Direct applicationThe EUT is isolated from earth and the surge is applied to its metallic enclosure; thetermination (or Auxiliary Equipment) at the port under test is earthed. See figures 15 and 16.NOTE - The earth reference mentioned in figure 15 or 16 represents a low impedance reference, preferablyrealized by either a dedicated cable or by a ground plane .All connections to the EUT other than the port under test shall be isolated from earth bysuitable means (such as safety isolation transformers or a suitable CDN).The length of the cable between the port under test and the device attached to the other endof the cable (AUX in figures 15 and 16) shall be the lesser of: the maximum length permittedby the EUT’s specification, or 20 m. Where the length exceeds 1 m, the cable may be non-inductively bundled.61000-4-5 © IEC: 200X1877B/409/CDRules for application of the surge to shielded lines:a) Shields earthed at both ends- the surge injection on the shield shall be carried out according to figure 15.b) Shields earthed at one end- the test shall be carried out according to figure 16. The capacitor C represents thecable capacity to earth and is not an additional component to be added to the test.. Ifcable lengths allow, the cable shall be on insulated supports 10cm above the groundplane or cable tray.The test level applied on shields is the generator with a 2 Ω source impedance.If the EUT does not have a metallic enclosure, apply the surge directly to the shield of the cable.For products which do not have metallic enclosures, the surge is applied directly to theshielded cable.7.6.2Indirect applicationSurges are applied in close proximity to the interconnection cable under test by a wire ormetallic tube according to figure 17. This coupling method is useful for multiple shielded cablewiring with multiple earth connections, between two or more EUTs (or one EUT and AE) of atest configuration in order to apply the surge to a particular cable or bundle of cables. Ifindividual cables are typically bundled in an installation, they should be tested in a bundle.The length of the cable between the port under test and the device attached to the other endof the cable shall be the lesser of: the maximum length permitted by the EUT’s specification,or 20 m. Where the length exceeds 1 m, the cable may be non-inductively bundled.For system connected via unshielded lines, the test setup according to figure 16 is applicableexcept that the cable shield and cable capacitance are not present.7.7Test set-up to apply potential differencesIn system level tests it may be necessary to apply potential differences which simulatevoltages that can occur within a system. The tests may be carried out in accordance withfigure 15 for systems with shielded lines, shields earthed at both ends, and in accordancewith figure 16 for systems with unshielded lines or shielded lines earthed only at one end.7.8Other test set-upsIf one of the specified coupling methods in the test set-up cannot be used for functionalreasons, alternative methods (suitable for the special case) shall be developed by productcommittees and the respective results shall be placed into product or product familystandards. It may be necessary to specify a performance criterion as it is mentioned in item c)of clause 9, 2nd paragraph for high speed communication lines; see clause 6.3.3 and 9.7.9Test conditionsThe operational test conditions and the installation conditions shall be in accordance with theproduct specification and shall include the:- test configuration (hardware);- test procedure (software).61000-4-5 © IEC: 200X88.1Test procedureLaboratory reference conditions1977B/409/CDIn order to minimize the impact of environmental parameters on test results, the test shall becarried out in climatic and electromagnetic reference conditions as specified in 8.1.1 and8.1.2.8.1.1Climatic conditionsUnless otherwise specified in generic, product family or product standards, the climaticconditions in the laboratory shall be within any limits specified for the operation of the EUTand the test equipment by their respective manufacturers.Tests shall not be performed if the relative humidity is so high as to cause condensation onthe EUT or the test equipment.8.1.2Electromagnetic conditionsThe electromagnetic environment of the laboratory shall not influence the test results.8.2Application of the surge in the laboratoryThe performance of the test generators and CDN shall be checked prior to the measurement.This performance check can usually be limited to the existence of the surge pulse and itsvoltage and/or current.The characteristics and performance of the test generators shall be as specified in 6.1.1 and6.2.1; the calibration of the generators shall be performed on a regular basis according to6.1.2 and 6.2.2. (typically once per year).The test shall be performed according to the test plan that shall specify (refer also B.2 ofannex B) the test set-up with :- generator and other equipment utilized;- test level (voltage) (refer to annex A);- generator source impedance;- polarity of the surge;- number of tests:o Number of surge pulses as far as not otherwise specified by the relevant productstandard: for DC power ports and interconnection lines at least five positive and fivenegative surge pulses; for AC power ports at least five positive and five negative pulses each at 0º,90º, 180º and at 270º.- time between successive pulses: one minute or less;- representative operating conditions of the EUT;- locations to which the surges are applied;- actual installation conditions.NOTE 1 - Power ports (AC or DC) can be input ports or output ports.NOTE 2 - Product committees may select different phase angles if appropriate for their product.Surges to output ports are recommended in applications where surges are likely to enter the EUT via that outputport (e.g. switching of loads with large power consumption).NOTE 3 - Surges to low voltage DC inputs ports (≤ 60 V) are not applied in the case, when the secondary circuitsare not subject to transient overvoltages (i.e. reliably-earthed, capacitively-filtered DC secondary circuits wherethe peak-to-peak ripple is less than 10% of the DC component.)61000-4-5 © IEC: 200X2077B/409/CDNOTE 4 - In the case of several identical circuits representative measurements on a selected number of circuitsmay be sufficient.NOTE 5 – Most protectors in common use have low average power capabilities even though their peak power orpeak energy handling can deal with high currents. Therefore, the time between two surges depends on the built-inprotection devices of the EUT.Information on the mode to perform the tests is given in B.2 of annex B.If not otherwise specified the surges on the ac mains shall be synchronized to the voltagephase at the respective angle and the peak value of the a.c. voltage wave (positive andnegative).When testing line to earth the test voltage has to be applied successively between each of thelines and earth, if there is no other specification.The test procedure shall also consider the non-linear current-voltage characteristics of theequipment under test. Therefore the test voltage has to be increased by steps up to the testlevel specified in the product standard or test plan.All lower levels including the selected test level shall be satisfied. For testing the secondaryprotection, the output voltage of the generator shall be adjusted to be just below the worstcase voltage breakdown level (let-through level) of the primary protection.If the actual operating signal sources are not available, they may be simulated. Under nocircumstances may the test level exceed the product specification. The test shall be carriedout according to a test plan.To find all critical points of the duty cycle of the equipment, a sufficient number of positive andnegative test pulses shall be applied. For acceptance test a previously unstressed equipmentshall be used or the protection devices shall be replaced.9Evaluation of test resultsThe test results shall be classified in terms of the loss of function or degradation ofperformance of the equipment under test, relative to a performance level defined by itsmanufacturer or the requestor of the test, or agreed between the manufacturer and thepurchaser of the product. The recommended classification is as follows:a)normal performance within limits specified by the manufacturer, requestor or purchaser;b)temporary loss of function or degradation of performance which ceases after thedisturbance ceases, and from which the equipment under test recovers its normalperformance, without operator intervention;c)temporary loss of function or degradation of performance, the correction of which requiresoperator intervention;d)loss of function or degradation of performance which is not recoverable, owing to damageto hardware or software, or loss of data.The manufacturer’s specification may define effects on the EUT which may be consideredinsignificant, and therefore acceptable.This classification may be used as a guide in formulating performance criteria, by committeesresponsible for generic, product and product-family standards, or as a framework for theagreement on performance criteria between the manufacturer and the purchaser, for examplewhere no suitable generic, product or product-family standard exists.10Test reportThe test report shall contain all the information necessary to reproduce the test. Inparticular, the following shall be recorded:61000-4-5 © IEC: 200X−−2177B/409/CDthe items specified in the test plan required by clause 8 of this standard;identification of the EUT and any associated equipment, e.g. brand name, producttype, serial number;−identification of the test equipment, e.g. brand name, product type, serial number;−any special environmental conditions in which the test was performed, e.g. shieldedenclosure;−any specific conditions necessary to enable the test to be performed;−performance level defined by the manufacturer, requestor or purchaser;−performance criterion specified in the generic, product or product-family standard;−any effects on the EUT observed during or after the application of the testdisturbance, and the duration for which these effects persist;−the rationale for the pass / fail decision (based on the performance criterion specifiedin the generic, product or product-family standard, or agreed between themanufacturer and the purchaser);−any specific conditions of use, for example cable length or type, shielding orgrounding, or EUT operating conditions, which are required to achieve compliance;−test configuration (hardware);−test configuration (software);Equipment shall not become dangerous or unsafe as a result of the application of the testsdefined in this part of IEC 61000.61000-4-5 © IEC: 200X2277B/409/CDURcCcRsRmLrHigh-voltage sourceCharging resistorEnergy storage capacitorPulse duration shaping resistorImpedance matching resistorRise time shaping inductorFigure 1 - Simplified circuit diagram of the combination wave generator61000-4-5 © IEC: 200X2377B/409/CDFront time:Time to half-value:T1 = 1,67 x T = 1,2 µs ± 30 %T2 = 50 µs ± 20 %.Figure 2 - Waveform of open-circuit voltage (1,2/50 µs) (waveform definition according to IEC60060-1)Front time:Time to half-value:T1 = 1,25 x T = 8 µs ± 20 %T2 = 20 µs ± 20 %.Figure 3. Waveform definition of short-circuit current (8/20us)(waveform definition according to IEC 60060-1)61000-4-5 © IEC: 200X2477B/409/CDUHigh-voltage sourceRcCharging resistorCcEnergy storage capacitorRsPulse duration shaping resistorRmImpedance matching resistorsCsRise time shaping capacitorS1Switch closed when using external matchingresistorsFigure 4 - Simplified circuit diagram of the 10/700 µs Surge generator61000-4-5 © IEC: 200X2577B/409/CDFront time:T1 = 1,67 x T = 10 µs ± 30 %Time to half-value:T2 = 700 µs ± 20 %.Figure 5 - Waveform of open-circuit voltage (10/700 µs) (waveform definition according to IEC60060-1)Figure 6 - Waveform of the 5 µs x 320 µs short-circuit current waveform (definition according toIEC 60060-1 and FCC Part 68)61000-4-5 © IEC: 200X2677B/409/CDFigure 7 - Example of test set-up for capacitive coupling on a.c./d.c. lines; line-to-linecoupling (according to 7.2)Figure 8 - Example of test set-up for capacitive coupling on a.c./d.c. lines; line-to-earthcoupling (according to 7.2)61000-4-5 © IEC: 200X2777B/409/CDFigure 9 - Example of test set-up for capacitive coupling on a.c. lines (3 phases); line L3 to lineL1 coupling (according to 7.2)61000-4-5 © IEC: 200X2877B/409/CDSwitch S2- during test positions 1 to 4Figure 10 - Example of test set-up for capacitive coupling on a.c. lines (3 phases); line L3 toearth coupling (according to 7.2)61000-4-5 © IEC: 200X2977B/409/CD1) Switch S1- line to earth: position 0- line to line: positions 1 to 42) Switch S2- during the test positions 1 to 4, but not in the same positionwith switch S13) L = 20 mH, RL represents the resistive part of LFigure 11 - Example of test set up for unshielded unsymmetrical interconnection lines; line-to-line and line-to-earth coupling (according to 7.3), coupling via capacitors61000-4-5 © IEC: 200X3077B/409/CD1) Switch S1- line to earth: position 0- line to line: positions 1 to 42) Switch S2- during the test positions 1 to 4, but not in the same positionwith switch S13) L = 20 mH, RL represents the resistive part of LFigure 12 - Example of test set-up for unshielded unsymmetrical interconnection lines; line-to-line and line-to-earth coupling (according to 7.3), coupling via arrestors61000-4-5 © IEC: 200X3177B/409/CDCalculation of Rm2 when using CWG (1,2/50 µs generator)Example for n = 4:Rm2 = 4 x 40 Ω = 160, max. 250 ΩCalculation of Rm2 when using 10/700 µs generatorThe internal matching resistor Rm2 (25 Ω) is replaced byexternal Rm2 = n x 25 Ω perconductor (for n conductors with n equal or greater than2).Example for n = 4:Rm2 = 4 x 25 Ω = 100 Ω, Rm2 shall not exceed 250 Ωc) L = 20 mH, current compensation must include all 4 coils tobe effective. RL: value depending on negligibleattenuation of the transmission signalFigure 13 - Example of test set-up for unshielded symmetrical interconnection lines(telecommunication lines); lines-to-earth coupling (according to 7.4), coupling viaarrestors61000-4-5 © IEC: 200X3277B/409/CDThe socket-like symbols in the figure mean connection points.Notes1.) L2 shall be a 4-coil current compensated choke to avoid saturation of coil due to phantom power feeding.Further L2 shall have a low resistive impedance; i.e. << 1 Ω. Resistors connected parallel to L2 may lower thetotal resistance.2.) RA and RB should have a value as low as possible to prevent oscillation or ringing.3.) RC and RD are meant to be isolation resistors of 40 ohms.4.) It is not recommended that this design be used with the 10/700 µs waveform since inductors will likelysaturate.Figure 14 - Example of a coupling/decoupling network for symmetrical high speedcommunication lines using the 1,2/50µs surge61000-4-5 © IEC: 200X3377B/409/CDFigure 15 - Example of test set-up for tests applied to shielded lines (according to7.6) and to apply potential differences (according to 7.7)61000-4-5 © IEC: 200X3477B/409/CDThe 10nF capacitance is representative of the cable capacitance to ground and NOT and additionalcomponent to be added to the test.Figure 16 - Example of test set-up for tests applied to unshielded lines and shielded linesearthed only at one end (according to 7.6) and to apply potential differences (according to 7.7)61000-4-5 © IEC: 200X3577B/409/CDFigure 17 – Coupling method and test set-up for tests applied to shielded lines and to applypotential differences, especially in configurations with multiple shielded cable wiring.Characteristics of the test set-up:(AUX shall be connected to GND.)Test generator is located near EUT 1;Common output of test generator is connected to structure of EUT 1;Impulse output of test generator is routed to AUX via an insulated injection line extremely closeto interface cable between EUT 1 and AUX (wrapped around tightly).With ILT ≈ I and ILN << I, the bulk injected current will run over the shield of the cable undertest (proximity effect).61000-4-5 © IEC: 200X3677B/409/CDAnnex A(normative)Selection of generators and test levelsThe selection of the test levels shall be based on the installation conditions. Unless otherwisespecified in product- or product family standards, table A.1 should be used, together withinformation and examples given in B.3 of annex B where:Class 0:Class 1:Class 2:Class 3:Class 4:Well-protected electrical environment, often within a special room.Partly protected electrical environment.Electrical environment where the cables are well separated, even at short runs.Electrical environment where cables run in parallel.Electrical environment where the interconnections are running as outdoorcables along with power cables, and cables are used for both electronic andelectric circuits.Electrical environment for electronic equipment connected totelecommunication cables and overhead power lines in a non-denselypopulated area.Special conditions specified in the product specification.Class 5:Class x:Additional information is given in figures B.1 to B.3 of annex B.To demonstrate the system level immunity additional measures relevant to the actualinstallation conditions, e.g. primary protection, should be taken.61000-4-5 © IEC: 200X3777B/409/CDTable A.1 - Selection of the test levels (depending on the installation conditions)Test levels (kV)InstallationclassAC Powersupply andAC I/Odirectlyconnected tothe mainsnetworkCouplingmodeLinetoline012345NANA0,51,02,01)AC Powersupply and ACI/O not directlyconnected tothe mainsnetworkCoupling modeLinetolineNANANA5)DC Power supplyand DC I/Odirectly connectedtheretoUnsymmetricaloperated4)Symmetricaloperatedcircuits/lines4)circuits/linesShielded I/OandcommunicationlinesCoupling modeLinetolineNANANA5)Coupling modeLinetolineNANA0,53)Coupling modeLinetolineNANANANALinetoearthNA0,51,02) 3)Coupling modeLinetolineNANANANALinetoearthNANA0,53)LinetoearthNA0,51,02,02)LinetoearthNANANA2) 5)LinetoearthNANANA2) 5)LinetoearthNA0,51,02) 3)1,05)2,02) 5)1,05)2,02) 5)1,03)2,02) 3)2,02) 3)2,03)4,01)2,02,04,02)2,02,04,02)2,02,04,02)NANA2,02)NANA4,03)4,04,04,04,04,01)Depends on the class of the local power supply system.2) Normally tested with primary protection.3) The test level may be lowered of one level if the cable length is shorter or equal to 10 meters.4) No test is advised at interconnection cables up to 10 m for data lines.5) If protection is specified upstream from the EUT, the test level should correspond to the protection level when theprotection is not in place.The surges (and test generators) related to the different classes are as in the following:Classes 1 to 4:Class 5:Class 1 to 5:1,2/50 µs (8/20 µs).1,2/50 µs (8/20 µs) for ports of power lines and short-distance signal circuits/lines.10/700 µs for symmetrical telecom linesThe source impedance shall be as indicated in the figures of the test set-ups concerned.61000-4-5 © IEC: 200X3877B/409/CDAnnex B(informative)Explanatory notesB.1 Different source ImpedanceThe selection of the source impedance of the generator depends on:- ---the kind of cable/conductor/line (a.c. power supply, d.c. power supply, interconnection,etc.);the length of the cables/lines;indoor/outdoor conditions;application of the test voltage (line to line or lines to earth).The impedance of 2 Ω represents the source impedance of the low-voltage power supplynetwork. The generator with its effective output impedance of 2 Ω is used.The impedance of 12 Ω (10 Ω + 2 Ω) represents the source impedance of the low-voltagepower supply network and earth. The generator with an additional resistor of 10 Ω in series isused.The effective impedance of 42 Ω (40 Ω + 2 Ω) represents the source impedance between allother lines and earth. The generator with an additional resistor of 40 Ω in series is used.In some countries (for instance, USA) other non-IEC standards for a.c. lines may require thetests according to figures 7 and 9 with a 2 Ω impedance; this is a more severe test. Thegeneral requirement is 10 Ω.B.2Application of the testsTwo different kinds of tests are to be distinguished: at equipment level and at system level.B.2.1 Equipment level immunityThe test shall be carried out in the laboratory on a single EUT. The immunity of the EUT thustested is referred to equipment level immunity.The test voltage shall not exceed the specified capability of the insulation to withstand high-voltage stress.B.2.2System level immunityThe test carried out in the laboratory refers to an EUT, but immunity at the EUT does notnecessarily assure the immunity of a larger system which contains that EUT. In order toensure system level immunity, a test at the system level is recommended to simulate the realinstallation. This simulated installation shall be comprised of individual EUTs and shall alsoinclude protective devices (Surge Protective Devices – SPDs) if they are stipulated by thesystem application manual. The real length and type of interconnection lines will be used, allof which can affect the overall system protection level. The simple addition of an external SPDthat is not co-ordinated with other internal SPDs, might have no effect, might reduce the effecton the overall system protection, or might improve overall system protection. Additionalinformation can be found in IEC Surge Protective Devices Standards, IEC 613 and IEC61312 (Protection against lightning electromagnetic impulse).This test is aimed at simulating as closely as possible the installation conditions in which theEUT or EUTs are intended to function.In a real installation, higher voltage levels can be applied, but the surge energy will be limitedby the installed protective devices in accordance with their current-limiting characteristics.61000-4-5 © IEC: 200X3977B/409/CDThe system level test is also intended to show that secondary effects produced by theprotective devices (change of waveform, mode, amplitude of voltages or currents) do notcause unacceptable effects on the EUT.B.3 Installation classificationClass 0Class 1Class 2Class 3Class 4Well-protected electrical environment, often within a special roomAll incoming cables are provided with overvoltage (primary and secondary)protection. The units of the electronic equipment are interconnected by a welldesigned earthing system, which is not essentially influenced by the powerinstallation or lightning.The electronic equipment has a dedicated power supply (see table A.1).Surge voltage may not exceed 25 V.Partly protected electrical environmentAll incoming cables to the room are provided with overvoltage (primary)protection.The units of the equipment are well interconnected by an earth line network,which is not essentially influenced by the power installation or lightning.The electronic equipment has its power supply completely separated from theother equipment.Switching operations can generate interference voltages within the room.Surge voltage may not exceed 500 V.Electrical environment where the cables are well separated, even at short runs.The installation is earthed via a separate earth line to the earthing system of thepower installation which can be essentially subjected to interference voltagesgenerated by the installation itself or by lightning. The power supply to theelectronic equipment is separated from other circuits, mostly by a specialtransformer for the power supply.Non-protected circuits are in the installation, but well separated and in restrictednumbers.Surge voltages may not exceed 1 kV.Electrical environment where power and signal cables run in parallelThe installation is earthed to the common earthing system of the powerinstallation which can be essentially subjected to interference voltages generatedby the installation itself or by lightning.Current due to earth faults, switching operations and lightning in the powerinstallation may generate interference voltages with relatively high amplitudes inthe earthing system. Protected electronic equipment and less sensitive electricequipment are connected to the same power supply network. The interconnectioncables can be partly outdoor cables, but close to the earthing network.Unsuppressed inductive loads are in the installation and usually there is noseparation of the different field cables.Surge may not exceed 2 kV.Electrical environment where the interconnections are running as outdoor cablesalong with power cables, and cables are used for both electronic and electriccircuits61000-4-5 © IEC: 200X4077B/409/CDThe installation is connected to the earthing system of the power installationwhich can be subjected to interference voltages generated by the installation itselfor by lightning.Currents in the kA range due to earth faults, switching operations and lightning inthe power supply installation may generate interference voltages with relativelyhigh amplitudes in the earthing system. The power supply network can be thesame for both the electronic and the electric equipment. The interconnectioncables are running as outdoor cables even to the high-voltage equipment.A special case of this environment is when the electronic equipment is connectedto the telecommunication network within a densely populated area. There is nosystematically constructed earthing network outside the electronic equipment, andthe earthing system consists of pipes, cables etc.only.Surge voltage may not exceed 4 kV.Class 5Electrical environment for electronic equipment connected to telecommunicationcables and overhead power lines in a non-densely populated areaAll these cables and lines are provided with overvoltage (primary) protection.Outside the electronic equipment there is no widespread earthing system(exposed plant). The interference voltages due to earth faults (currents up to 10kA) and lightning (currents up to 100 kA) can be extremely high.The requirements of this class are covered by the test level 4 (see annex A).Class xSpecial conditions specified in the product specificationsB.4Equipment level immunity of ports connected to the power supply networkThe minimum immunity level for connection to the public supply network is:- Line-to-line coupling:- Line-to-earth coupling:B.50,5 kV (test set-up see figures 6 and 8).1 kV (test set-up see figures 7 and 9).Equipment level immunity of ports connected to interconnection linesSurge tests on interconnection circuits are only required for external connections (outside ofthe cabinet/housing).If it is possible to test at the system level (EUT with interconnection cables connected) it isnot necessary to test at the equipment level especially in cases where the shield of theinterconnection cable is part of the protection measure. If the installation of the plant iscarried out by someone other than the manufacturers of the equipment, the admissiblevoltage for the inputs/outputs (especially for the process interface) of the EUT should bespecified.The manufacturer should test his equipment on the basis of the specified test levels toconfirm the equipment level immunity, e.g. with secondary protection at the ports of the EUTfor a level of 0,5 kV. The user of the plant or those responsible for the installation should thenapply measures (e.g. shielding, bonding, earthing protection) necessary to ensure that theinterference voltage caused by, for example, lightning strokes does not exceed the chosenimmunity level.61000-4-5 © IEC: 200XB.177B/409/CDCoupling of Surges to multiple shielded cable wiringThe following explanations are given related to figure B.1.As for the test set-up:------ - shielded cables in this case: coaxial cables RG142; length, each: 21 meters;generator: outputs: L - N ( 2 Ω ); amplitude during tests: + 250 V;coaxial cable(s) contacted with a twin shielding case at peripheral end; load: 50 Ω;peripheral shielding case alternatively contacted with shielded chamber structure orfloating.coaxial feed through at the measuring end; measurement with oscilloscope outside ofthe shielded chamber; load 50 Ω.the surge current flows from the measuring end to the peripheral end o fthe shieldedcables via injection line that is tightly wrapped around the cable under test. -distance of tested cable to parallel shielded cable, if present: 15 cm.Scope BNC-connectors twin shielding case 50Ω50Ω with / without parallel cabel ; distance 15 cm cable under test; 21m; meander-routing 50Ω injection line; 21m tightly wrapped around50Ω„peripheral“SURGE- generator outputs: L-N (2Ω) earthed / floating, rsp. operating room shieldedchamberFigure B.1 - Surge injection via injection line extremely close to interface cable between EUT 1and EUT 2.Copyright © 2004 International Electrotechnical Commission, IEC. 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