专利名称:METHOD AND SYSTEM FOR GENERATING
LENGTH DEVIATION STATISTICS, ANDMETHOD AND SYSTEM FOR TUNINGCONTROL PARAMETER OF OPTICALSTORAGE DEVICE USING THE SAME
发明人:Chih-Ching Yu申请号:US11306586申请日:20060103
公开号:US20070153660A1公开日:20070705
专利附图:
摘要:A method for generating length deviation statistics utilized for controllingoperation of an optical storage device, includes: detecting a plurality of pattern lengths,each pattern length corresponding to data on an optical storage medium accessed bythe optical storage device; and performing calculations according to the pattern lengthsto generate length deviation statistics associated with the pattern lengths.
申请人:Chih-Ching Yu
地址:Tao-Yuan Hsien TW
国籍:TW
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