专利名称：METHOD AND SYSTEM FOR GENERATING
LENGTH DEVIATION STATISTICS, ANDMETHOD AND SYSTEM FOR TUNINGCONTROL PARAMETER OF OPTICALSTORAGE DEVICE USING THE SAME
发明人：Chih-Ching Yu申请号：US11306586申请日：20060103
公开号：US20070153660A1公开日：20070705
专利附图：
摘要：A method for generating length deviation statistics utilized for controllingoperation of an optical storage device, includes: detecting a plurality of pattern lengths,each pattern length corresponding to data on an optical storage medium accessed bythe optical storage device; and performing calculations according to the pattern lengthsto generate length deviation statistics associated with the pattern lengths.
申请人：Chih-Ching Yu
地址：Tao-Yuan Hsien TW
国籍：TW
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