IC pin forming machine with integrated IC testing

专利名称：IC pin forming machine with integrated IC

testing capability

发明人：Jerry A. Young,Steven L. Mitchell,Steven W.

Heppler

申请号：US07/9253申请日：19921211公开号：US05248075A公开日：19930928

摘要：The present invention relates to integrated circuits (ICs) fabrication and testing.Particularly, there is an IC pin/lead trimming and forming machine that is adapted toelectrically test ICs for electrical defects. Uniquely, the IC testing can occur at any pinforming station after the IC pins or leads have been electrically isolated from each otherand from other ICs on a lead frame. This arrangement will allow for testing of theindividual ICs much sooner than has hereinbefore existed after undertaking theencapsulation process.

申请人：MICRON TECHNOLOGY, INC.

代理人：Michael W. Starkweather

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