Memory testing system

专利名称：Memory testing system

发明人：Dragos F. Botea,Bibo Li,Vijay M. Bettada申请号：US14495506申请日：20140924公开号：US09514842B2公开日：20161206

专利附图：

摘要：Techniques are disclosed relating to memory testing. In one embodiment, anintegrated circuit is disclosed that includes a memory and an interface circuit. Theinterface circuit is configured to receive one or more testing signals from a built in self-test (BIST) unit. The interface circuit is further configured to receive, independently from

the one or more testing signals, one or more configuration signals from automated testequipment (ATE). The interface circuit is further configured to issue one or more

instruction signals to the memory based on the one or more testing signals and based onthe one or more configuration signals. In some embodiments, the interface circuit isconfigured to enable the BIST unit to detect errors in functions the BIST unit is notdesigned to test.

申请人：Apple Inc.

地址：Cupertino CA US

国籍：US

代理机构：Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.

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