MEMORY TESTING SYSTEM

专利名称：MEMORY TESTING SYSTEM发明人：Kevin J. Duffy,William V. Huott,Pradip

Patel,Daniel Rodko

申请号：US12797181申请日：20100609

公开号：US20110307747A1公开日：20111215

专利附图：

摘要：An array built-in self test (ABIST) system includes a first latch having a first datainput, a first scan input and first output and a second latch having a second data input, asecond scan input and a second output. The system also includes a first ABIST logic block

coupled to the first output that compares a first expected value with a first data valuereceived at the first data input and provided to the first ABIST logic block after a firstclock is applied to the first latch. The system also includes a second ABIST logic blockcoupled to the second output that compares a second expected value with a second datavalue received at the second data input and provided to the second ABIST logic blockafter a second clock is applied to the second latch.

申请人：Kevin J. Duffy,William V. Huott,Pradip Patel,Daniel Rodko

地址：Highland NY US,Holmes NY US,Poughkeepsie NY US,Poughkeepsie NY US

国籍：US,US,US,US

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