Evaluation device and evaluation system

专利名称：Evaluation device and evaluation system发明人：河合 継申请号：JP2019106080申请日：20190606公开号：JP6618162B1公开日：20191211

摘要：Problem to be solved: to provide an evaluation apparatus and an evaluationsystem capable of improving evaluation accuracy. Evaluation device 1 for evaluatingthree-dimensional data based on the surface state of evaluation object 3Positional dataindicating the coordinates of three-dimensional space for the object 3 to be evaluatedAacquiring section for acquiring the three-dimensional data having a plurality of color dataindicative of the color in the position data of the object to be evaluated and

thePreviously acquired 3D data andA reference database storing a learning model havinglinkage between reference information linked to the past three dimensional data and thereference informationRefer to the reference database.An evaluation part for generatingevaluation results for the three-dimensional data andIs provided.Diagram

申请人：クリスタルメソッド株式会社

地址：東京都千代田区九段北４丁目１－１４ＴＬビル５Ｆ

国籍：JP

代理人：安彦 元

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