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Evaluation device and evaluation system

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专利名称:Evaluation device and evaluation system发明人:河合 継申请号:JP2019106080申请日:20190606公开号:JP6618162B1公开日:20191211

摘要:Problem to be solved: to provide an evaluation apparatus and an evaluationsystem capable of improving evaluation accuracy. Evaluation device 1 for evaluatingthree-dimensional data based on the surface state of evaluation object 3Positional dataindicating the coordinates of three-dimensional space for the object 3 to be evaluatedAacquiring section for acquiring the three-dimensional data having a plurality of color dataindicative of the color in the position data of the object to be evaluated and

thePreviously acquired 3D data andA reference database storing a learning model havinglinkage between reference information linked to the past three dimensional data and thereference informationRefer to the reference database.An evaluation part for generatingevaluation results for the three-dimensional data andIs provided.Diagram

申请人:クリスタルメソッド株式会社

地址:東京都千代田区九段北4丁目1-14TLビル5F

国籍:JP

代理人:安彦 元

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